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	Journal of applied crystallography
	Common abbreviations: J. Appl. Cryst. [DE-600] J. Appl. Crystallogr. [DE-600] J. Appl. Crystallogr. (Denmark) [DE-600] J Appl Crystallogr [iso] J Appl Crystallogr [dnlm] J Appl Crystallogr [iso]

Type:	journal
DDC:	540
Keywords(s):	Kristallographie, Zeitschrift, Online-Ressource, Kristallographie, Zeitschrift, General Biochemistry, Genetics and Molecular Biology
CODEN:	JACGA
ISSN(s):	0021-8898, 1600-5767
Publisher:	Munksgaard : Copenhagen 1968-
Country:	Denmark
Appears:	print, online
ID:	PERI:(DE-600)2020879-0

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; DEAL Wiley ; Ebsco Academic Search ; Essential Science Indicators ; IF >= 5 ; JCR ; Nationallizenz ; PubMed Central ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

Recent Publications

All known publications ...
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http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article (Review Article) Weirich, T. E.RWTH*
RAPIDviewer : an ImageJ script for visualization and analysis of indexed electron diffraction patterns of cubic materials
Journal of applied crystallography 59(2), 1-5 (2026) [10.1107/S1600576726002086]2026   BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Qaiser, M. H. ; Berners, L.RWTH* ; Scales, R. J. ; Zhang, T. ; Heller, M.RWTH* ; Dluhoš, J. ; Korte-Kerzel, S.RWTH* ; Britton, T. B. (Corresponding author)
AstroECP: towards more practical electron channeling contrast imaging
Journal of applied crystallography 59(Part 2), 1-22 (2026) [10.1107/S1600576726000567]2026     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Gasser, F. ; John, S. ; Smets, J. ; Simbrunner, J. ; Fratschko, M. ; Rubio-Giménez, V. ; Ameloot, R. ; Steinrück, H.-G. ; Resel, R.
A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction
Journal of applied crystallography 58(4), 1288-1298 (2025) [10.1107/S1600576725004935]2025   BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Gasser, F. ; Simbrunner, J. ; Huck, M. ; Moser, A. ; Steinrück, H.-G. ; Resel, R.
Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors
Journal of applied crystallography 58(1), 96-106 (2025) [10.1107/S1600576724010628]2025   BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Vonk, V. (Corresponding author) ; Tober, S. ; Leake, S. J. ; Rabelo Coutinho Saraiva, B. ; Randolph, L. ; Dangwal Pandey, A. ; Keller, T. F. ; Steinrück, H.-G.RWTH* ; Stierle, A. (Corresponding author)
X-ray reflectivity from micrometre-scaled surfaces using nanobeams
Journal of applied crystallography 58(6), 1978-1985 (2025) [10.1107/S1600576725008179]2025     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Gommes, C. J. (Corresponding author) ; Matsarskaia, O. ; Pusterla, J. M. ; Westarp, I.RWTH* ; Wu, B. ; Czakkel, O. ; Stadler, A. (Corresponding author)RWTH*
Model for small-angle scattering analysis of membranes with protein-like inclusions
Journal of applied crystallography 58(5), 1571-1581 (2025) [10.1107/S1600576725007277]2025     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Meurer, F. ; Schimpf, M. ; Hischa, B. ; Hennig, C. ; Rehbein, J. ; Kleemiss, F.RWTH* ; Bodensteiner, M. (Corresponding author)
Synthesis and quantum crystallographic evaluation of WYLID: YLID's red rival
Journal of applied crystallography 58(3), 678-687 (2025) [10.1107/S160057672500175X]2025     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Kleemiss, F. (Corresponding author)RWTH* ; Meurer, F. ; Shenderovich, I. G. ; Bodensteiner, M.
The use of effective core potentials in Hirshfeld atom refinement: making quantum crystallography faster in NoSpherA2
Journal of applied crystallography 58(2), 374-382 (2025) [10.1107/S1600576725000901]2025     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article (Letter) Weirich, T. E. (Corresponding author)RWTH*
RAPID : an ImageJ macro for indexing electron diffraction zone axis spot patterns of cubic materials
Journal of applied crystallography 57(6), 2017-2029 (2024) [10.1107/S1600576724010215]2024     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Meinerzhagen, Y. A.RWTH* ; Eickmeier, K.RWTH* ; Müller, P. C.RWTH* ; Hempelmann, J.RWTH* ; Houben, A. ; Dronskowski, R. (Corresponding author)RWTH*
Multidimensional Rietveld refinement of high-pressure neutron diffraction data of PbNCN
Journal of applied crystallography 57(5), 1436-1445 (2024) [10.1107/S1600576724007635]2024     Files BibTeX | EndNote: XML, Text | RIS

All known publications ...
Download: BibTeX | EndNote XML,  Text | RIS |