Review of Manufacturing Process Defects and Their Effects on Memristive Devices

Poehls, Leticia Maria Bolzani; Santos Copetti, T.; Brum, E.; Hamdioui, S.; Fieback, M. C. R.; Hoffmann-Eifert, S.; Menzel, Stephan; Gemmeke, Tobias

doi:WOS:000709238700001

Review of Manufacturing Process Defects and Their Effects on Memristive Devices

Poehls, Leticia Maria Bolzani (Corresponding author)^RWTH* ; Fieback, M. C. R. ; Hoffmann-Eifert, S.^RWTH* ; Santos Copetti, T.^RWTH* ; Brum, E. ; Menzel, Stephan^RWTH* ; Hamdioui, S. ; Gemmeke, Tobias^RWTH*

In
Journal of electronic testing 37(4), Seiten/Artikel-Nr.:427-437

2021

ImpressumDordrecht [u.a.] : Springer Science + Business Media B.V

ISSN1573-0727

Online
DOI: 10.18154/RWTH-2021-10244
DOI: 10.1007/s10836-021-05968-8
10.1007/s10836-021-05968-8
URL: https://publications.rwth-aachen.de/record/835039/files/835039.pdf

Einrichtungen

Thematische Einordnung (Klassifikation)
DDC: 670

OpenAccess:
PDF

Dokumenttyp
Journal Article (Review Article)

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85117403194
WOS Core Collection: WOS:000709238700001

Interne Identnummern
RWTH-2021-10244
Datensatz-ID: 835039

Beteiligte Länder
Brazil, Germany, Netherlands

Lizenzstatus der Zeitschrift

;

; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; DEAL Springer ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; Nationallizenz